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TC74HC4094AP/AF/AFN
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74HC4094AP,TC74HC4094AF,TC74HC4094AFN
8-Bit Shift and Store Register (3-state)
Note: xxxFN (JEDEC SOP) is not available in Japan.
The TC74HC4094A is a high speed CMOS 8-BIT SHIFT AND STROBE REGISTER fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. It consists of an 8-bit shift register and an 8-bit latch with 3-state output buffers. Data is shifted serially though the shift register on the positive going transition of the CK input. The output of the last stage (Qs) can be used to cascade several devices. Data on the Qs output is transferred to a second output (Q's) on the following negative transition of the CK input. The data in each stage of the shift register is provided to a corresponding latch, on the negative going transition of the STROBE input. When STROBE is held high, data propagates through the latch to a 3-state output buffer. This buffer is enabled when OUTPUT ENABLE input is set high. All inputs are equipped with protection circuits against static discharge or transient excess voltage.
TC74HC4094AP
TC74HC4094AF
Features
* * * * *
*
TC74HC4094AFN
High speed: fmax = 73 MHz (typ.) at VCC = 5 V Low power dissipation: ICC = 4 A (max) at Ta = 25C High noise immunity: VNIH = VNIL = 28% VCC (min) Output drive capability: 10 LSTTL loads Symmetrical output impedance: |IOH| = IOL = 4 mA (min) Balanced propagation delays: tpLH - tpHL Wide operating voltage range: VCC (opr) = 2 to 6 V Pin and function compatible with 4094B Weight DIP16-P-300-2.54A SOP16-P-300-1.27A SOL16-P-150-1.27
* *
Pin Assignment
: 1.00 g (typ.) : 0.18 g (typ.) : 0.13 g (typ.)
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IEC Logic Symbol
Truth Table
CK OE H H H L H L ST H H L * * * SI L H * * * * Para. Out Q1 L H NC Z NC Z Qn Qn - 1 Qn - 1 NC Z NC Z Seri. Out Qs Q7 Q7 Q7 Q7 NC NC Q's NC NC NC NC Qs Qs
X: Don't care NC: No change Z : High impedance
Timing Chart
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System Diagram
Absolute Maximum Ratings (Note 1)
Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating -0.5 to 7 -0.5 to VCC + 0.5 -0.5 to VCC + 0.5 20 20 25 50 500 (DIP) (Note 2)/180 (SOP) -65 to 150 Unit V V V mA mA mA mA mW C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = -40 to 65C. From Ta = 65 to 85C a derating factor of -10 mW/C shall be applied until 300 mW.
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Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol VCC VIN VOUT Topr Rating 2 to 6 0 to VCC 0 to VCC -40 to 85 0 to 1000 (VCC = 2.0 V) Input rise and fall time tr, tf 0 to 500 (VCC = 4.5 V) 0 to 400 (VCC = 6.0 V) ns Unit V V V C
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND.
Electrical Characteristics
DC Characteristics
Test Condition Characteristics Symbol VCC (V) 2.0 High-level input voltage VIH 4.5 6.0 2.0 Low-level input voltage VIL 4.5 6.0 2.0 High-level output voltage VIN = VIH or VIL IOH = -20 A IOH = -4 mA IOH = -5.2 mA IOL = 20 A IOL = 4 mA IOL = 5.2 mA 3-state output off-state current Input leakage current Quiescent supply current IOZ IIN ICC VIN = VIH or VIL VOUT = VCC or GND VIN = VCC or GND VIN = VCC or GND 4.5 6.0 4.5 6.0 2.0 Low-level output voltage VIN = VIH or VIL 4.5 6.0 4.5 6.0 6.0 6.0 6.0 Min 1.50 3.15 4.20 1.9 4.4 5.9 4.18 5.68 Ta = 25C Typ. 2.0 4.5 6.0 4.31 5.80 0.0 0.0 0.0 0.17 0.18 Max 0.50 1.35 1.80 0.1 0.1 0.1 0.26 0.26 0.5 0.1 4.0 Ta = -40 to 85C Min 1.50 3.15 4.20 1.9 4.4 5.9 4.13 5.63 Max 0.50 1.35 1.80 0.1 0.1 0.1 0.33 0.33 5.0 1.0 40.0 A A A V V V V Unit
VOH
VOL
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Timing Requirements (input: tr = tf = 6 ns)
Characteristics Symbol Test Condition VCC (V) Minimum pulse width (CK) tW (H) tW (L) 2.0 4.5 6.0 2.0 tW (H) 4.5 6.0 2.0 ts 4.5 6.0 2.0 ts 4.5 6.0 2.0 th 4.5 6.0 2.0 th 4.5 6.0 2.0 Clock frequency f 4.5 6.0 Ta = 25C Typ. Limit 75 15 13 75 15 13 75 15 13 100 20 17 0 0 0 0 0 0 6 30 35 Ta = -40 to 85C Limit 95 19 16 95 19 16 95 19 16 125 25 21 0 0 0 0 0 0 5 24 28 MHz ns ns ns ns ns ns Unit
Minimum pulse width (STROBE)
Minimum set-up time (SERIAL)
Minimum set-up time (STROBE)
Minimum hold time (SERIAL)
Minimum hold time (STROBE)
AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25C, input: tr = tf = 6 ns)
Characteristics Output transition time Propagation delay time (CK-Qn) Propagation delay time (CK-QS, Q'S) Propagation delay time (STROBE-Qn) 3-state output enable time Maximum clock frequency Symbol tTLH tTHL tpLH tpHL tpLH tpHL tpLH tpHL tpZL tpZH fmax RL = 1 k Test Condition Min Typ. 4 Max 8 Unit ns
22
35
ns
16
25
ns
16
27
ns
33
13 73
25
ns MHz
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AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns)
Test Condition Characteristics Symbol VCC (V) 2.0 4.5 6.0 2.0 4.5 6.0 2.0 4.5 6.0 2.0 4.5 6.0 2.0 RL = 1 k 4.5 6.0 2.0 RL = 1 k 4.5 6.0 2.0 Maximum clock frequency Input capacitance Bus input capacitance Power dissipation capacitance fmax 4.5 6.0 CIN COUT CPD (Note) Min 6 30 35 Ta = 25C Typ. 30 8 7 92 26 20 65 19 15 75 20 16 58 16 13 35 16 13 16 66 80 5 10 140 Max 75 15 13 200 40 34 150 30 26 160 32 27 150 30 26 150 30 26 10 Ta = -40 to 85C Min 5 24 28 Max 95 19 16 250 50 43 190 38 32 200 40 34 190 38 32 190 38 32 10 pF pF pF MHz ns ns ns ns ns ns Unit
Output transition time
tTLH tTHL tpLH tpHL
Propagation delay time (CK-Qn) Propagation delay time (CK-QS, Q'S) Propagation delay time (STROBE-Qn)
tpLH tpHL
tpLH tpHL
3-state output enable time
tpZL tpZH
3-state output disable time
tpLZ tpHZ
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPDVCCfIN + ICC
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Package Dimensions
Weight: 1.00 g (typ.)
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Package Dimensions
Weight: 0.18 g (typ.)
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Package Dimensions (Note)
Note: This package is not available in Japan. Weight: 0.13 g (typ.)
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RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN GENERAL
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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